Un-jointed Probe of IEC

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Un-jointed Probe of IEC 61032

Purpose:

This probe may be used to verify the protection of persons against access to hazardous parts and to verify the mechanical strength of openings in the enclosure or internal barriers.

Conforms to:

Standard IEC61032-1997 etc.

Technical Parameter:

Test probe diameter: 12 mm

Test probe length: 80 mm

Baffle plate thickness: 5 mm

Baffle plate diameter: 50 mm

Company introduction

HK LEE HING INDUSTRY CO., LIMITED are specialized in manufacturing special, custom built, test and measuring equipment for products testing as per international norms and offering calibration services and related information. Our products and services are used by research & development establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients' requirements.

Main Products: Go No Go Gauges, IP Tester, Test Probe Kit, Impact Test Equipment, Test Probes, Spring Hammer, IEC 61032 Test Finger, AC Hipot Tester, IEC Test Probe, UL Test Probe, Material Flammability Tester, IP Code Tester, Impact Test Apparatus, Plugs and Socket Outlet Gauge, Security Testing Machine, Lamp Cap Gauge Tester, Lampholders Gauge Tester, Plug & Socket Tester, Electrical Safety Tester, LED Test Instruments, Environmental Test Equipment, Instrument Accessories, Weighing Sensor and More.

If you require equipment to test products such as home appliances, electrical accessories like switches, sockets, connectors, etc. industrial & road lighting luminaires, automobile lighting systems or related categories, we can provide the solutions you need.

We would appreciate your comments on the layout design, presentation or other aspects of our website.

Website: https://www.iec-equipment.com